Nanotechnology and Microsystems Laboratory

Since 2007 the N&M laboratory is certified under ISO 9001:2000 for the Si processing and electrical characterization and under ISO 17025:2005 for the electrical measurements. It comprises the cleanroom, surface and materials characterization as well as electrical characterization facilities. The cleanroom facilities include a full Si processing laboratory in a clean room area (500m2, ISO 6 and ISO 5 clean areas), equipped with unique at national level and state-of-the-art tools such as ion implanter and e-beam lithography (EBL). The newly installed 100keV modern EBL tool is capable of sub-10nm patterning on up to 150mm wafer-size.

M. Vasilopoulou, A.M. Douvas, D.G. Georgiadou, L.C. Palilis, S. Kennou, L. Sygellou, A. Soultati, I. Kostis, G. Papadimitropoulos, D. Davazoglou and P. Argitis
The influence of hydrogenation and oxygen vacancies on molybdenum oxides work function and gap states for application in organic optoelectronics
J. Am. Chem. Soc. 134, 16178-16187 (2012)

M. Vasilopoulou, L.C. Palilis, D. G. Georgiadou, S. Kennou, I. Kostis, D. Davazoglou, P. Argitis
Barrierless hole injection through sub-bandgap occupied states in OLEDs using substoichiomeric MoOx anode interfacial layer,
Appl. Phys. Letters, 100, 013311, (2012)

M. Vasilopoulou, D.G. Georgiadou, L.C. Palilis, P. Argitis, S. Kennou, L. Sygellou, N. Konofaos, A. Iliadis, I. Kostis, G. Papadimitropoulos, D. Davazoglou
Reduced Transition Metal Oxides as Electron Injection Layers in Hybrid-PLEDs,
Microelectron. Eng., 90, 59-61, (2012)

M. Vasilopoulou, G. Papadimitropoulos, L.C. Palilis, D. G. Georgiadou, P. Argitis, S. Kennou, I. Kostis, N. Vourdas, N.A. Stathopoulos, D. Davazoglou
High performance organic light emitting diodes using substoichiometric tungsten oxide as efficient hole injection layer,
Organic Electronics, 13, 796-806, (2012)

M. Vasilopoulou, A.M. Douvas, P. Argitis
Patternable Fluorinate Polyhedral Oligomeric Silsequioxane-Functionalized polymer materials with ultra low dielectric constants
Materials Chemistry and Physics, 135, 880-83, (2012)

D. Velessiotis, A.M. Douvas, P. Dimitrakis, P. Argitis, N. Glezos
Conduction mechanisms in tungsten-polyoxometalate self-assembled molecular junction
Microelectronic Engineering, 97, 150-53, (2012)

D. G. Georgiadou, L. C. Palilis, M. Vasilopoulou , G. Pistolis , D. Dimotikali and P. Argitis
Effect of triphenylsulfonium triflate addition in wide band-gap polymer light-emitting diodes: improved charge injection, transport and electroplex-induced emission tuning
RSC Adv., 2 (31) , pp. 11786-11792, (2012)

Vourdas N., Papadimitropoulos G., Kostis I., Vasilopoulou M., Davazoglou, D.
Substoichiometric hot-wire WOx films deposited in reducing environment
Thin Solid Films, 520, 3614, (2012)

Vourdas N., Dalamagkidis K., Kostis I., Vasilopoulou M., Davazoglou, D
Omnidirectional antireflective properties of porous tungsten oxide films with in-depth variation of void fraction and stoichiometry Optics Communications, 285, 5229-5234, (2012)

Kontziampasis, D., Constantoudis, V., Gogolides, E.
Plasma directed organization of nanodots on polymers: Effects of polymer type and etching time on morphology and order
Plasma Processes and Polymers, 9 (9), pp. 866-872 (2012)

Patriarchou Grigoriou E 32, Ag. Paraskevi 153 41, Greece