ThetaMetrisis is a privately held company that was established in December 2008 in Athens, Greece by Ph.D. engineers in the field of optics and sensors technology. ThetaMetrisis is the first spin-off company of the Institute of Microelectronics, NCSR ‘Demokritos’. The company was focused on the design and manufacturing of optical metrology tools for the characterization of thin and thick films, the FR-Series. FR-tools are based on White Light Reflectance Spectroscopy (WLRS), a methodology that was developed at the Institute of Microelectronics, by ThetaMetrisis founders for accurate and simultaneous measurement of the thickness and the refractive index of stacked thin and thick films.
Polydefkous 14 & 16 12243 Athens, Greece